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The Fast Access Controller (FAC) is an innovative solution designed to enhance the efficiency of processor and ASIC/SoC systems by improving the execution of in-system tests and programming. This pre-engineered IP offers a comprehensive framework for high-speed on-board Flash programming, tailored to meet demanding production environments. FAC is highly effective in reducing programming times and enhancing the support for external flash memories connected to FPGAs.\n\nFAC allows for a streamlined, scalable approach to managing the complexity of modern circuits during manufacturing, minimizing integration complexity and enhancing production throughput. By enabling the rapid programming of Flash memory via the 1149.1 interface, FAC helps designers quickly adapt to varied customer needs, offering a cost-effective alternative to traditional methods.\n\nIntegrated within the Eclipse Test Environment, FAC supports the design-for-test infrastructure, minimizing time and cost associated with debugging and system validation. This ensures that high-quality, programmable electronics are both achievable and identifiable, enhancing the overall efficacy of manufacturing strategies.
SystemBIST is a sophisticated, vendor-independent plug-and-play IC tailored for the flexible configuration of FPGAs on PCBs. The aim of this solution is to simplify the FPGA configuration and testing processes by eliminating the need for PROMs and complex firmware. SystemBIST utilizes the IEEE 1149.1 and IEEE 1532 standards, ensuring broad applicability across different vendor products while maintaining high quality and configuration flexibility.\n\nThe hallmark of SystemBIST is its ability to execute deterministic Built-In Self Test (BIST) for PCBs and system-level components. This significantly simplifies the testing process as embedded test patterns and scripts can be reused, providing reliable testing scenarios without additional software efforts. SystemBIST’s capabilities extend beyond FPGA programming, enabling re-programming and testing of CPLDs and other components in the field, ensuring products remain adaptable and secure.\n\nWith comprehensive support from Intellitech’s Eclipse Test Development Environment, SystemBIST provides a centralized framework for the generation, validation, and application of test suites, integrating seamlessly with existing system configurations. This capability is complemented by SystemBIST’s robust anti-tamper and counterfeit protection, featuring embedded security measures to safeguard the integrity of designs.
The Scan Ring Linker (SRL) module is designed for seamless integration into complex PCB architectures, facilitating the management of multiple scan chains in JTAG environments. It permits multiple independent scan rings to be efficiently managed through a single 1149.1 interface, reducing design complexity and enhancing testing coverage. This tool is instrumental for teams working with intricate digital constructions where multiple scan chains are employed.\n\nSRL streamlines the connectivity between complex devices, ensuring quick access and configuration via high-speed test buses. This contributes to overall reductions in cost by eliminating the need for multiple test interfaces or redundant hardware architectures. It simplifies design processes by optimizing the testing and configuration procedures for FPGA, CPLD, and ASIC designs, aligning them with contemporary efficiency standards.\n\nHoused under the Eclipse Test Development Environment, SRL exemplifies Intellitech’s commitment to delivering modular, scalable solutions that enhance the in-system testing and configuration processes. This product makes it easier to troubleshoot and confirm system integrity, providing invaluable support in both the development and manufacturing phases of product lifecycle management.
JTAG Test and Configuration is a comprehensive solution for testing and configuring PCBs and electronic devices using the IEEE 1149.1 standard, commonly known as JTAG. This product is designed to streamline and enhance the design and test phases of electronic products. It facilitates high-quality, self-testable devices that are reconfigurable in the field, offering cost-effective testing solutions for a range of applications. Featuring plug-and-play components, this solution lowers system costs and simplifies design by integrating with existing infrastructure.\n\nThe system supports ARM CPU emulation tests and analog tests, offering robust support for complex PCBs. It leverages a powerful test development environment that incorporates schematic-based debugging, significantly reducing development time by allowing engineers to interact with logic views intuitively. This framework facilitates the testing of prototypes, ensuring quick identification and resolution of PCB shorts and opens, enhancing overall production quality and efficiency.\n\nBy integrating concurrent boundary scan capabilities, this product supports scalable testing solutions, enhancing production bandwidth without bottlenecks. It also supports a wide range of corresponding test tools, ensuring comprehensive coverage and high yield in PCB manufacturing processes. Its ability to support both single unit and multiple unit testing per session ensures flexibility and scalability, making it an essential tool for modern PCB production lines.
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