Xilinx FPGA Test Patterns by Polybus Systems are designed to provide extensive testing for all Xilinx FPGAs, offering a tailored approach to validate and secure FPGA functionalities. The test suite, consisting of over 400 dedicated patterns, ensures the detection and mitigation of defects that may arise due to handling issues or during early life failures.
The comprehensive nature of these patterns supports significant testing, enhancing the reliability and future proofing of FPGA systems. The suite is suitable for both in-system testing and traditional chip testing environments, allowing users to adapt it based on their specific requirements and timing. By significantly surpassing the limitations of manufacturer-supplied tests, Polybus’s patterns help reduce the defect incidence by a remarkable two orders of magnitude.
Customization capabilities within the test patterns ensure they can meet diverse system needs, supporting a wide array of interface requirements like JTAG scan chains or dedicated pin configurations. Polybus’s experience with multiple generations of FPGAs enables it to provide advanced and reliable testing solutions that underpin effective system upgrades and enhanced operational consistency.
