The JTAG Test and Configuration product line is part of Intellitech's innovative offerings for IEEE 1149.1 boundary scan test and configuration. This toolset provides design and test engineers with a robust solution for in-system device configuration, debugging, and automated testing of PCBs and complex electronic systems. By utilizing the industry-standard JTAG protocol, the product line facilitates high fault coverage and quick test development, which is critical in reducing overall product development costs and time-to-market.
This solution offers a seamless integration with the Eclipse Test Development Environment, enabling engineers to conduct interactive debugging and apply pre-validated test suites in both laboratory and production environments. With features like deterministic test patterns and pin-level diagnostics, engineers can identify and rectify issues swiftly, ensuring comprehensive coverage of digital interconnects.
Moreover, the JTAG Test and Configuration suite supports extensive in-system programming and reconfiguration capabilities, making it an essential tool in maintaining firmware and software updates throughout the product lifecycle. This ensures that products remain adaptable to changing requirements and remain at peak performance.