The ELFIS2 Image Sensor is a high-performance visible light imager designed to withstand harsh environments. Its standout feature is the robust radiation hardness, making it ideal for applications requiring extreme reliability under radiation exposure. The design ensures resistance against total ionizing dose (TID), single event latch-up (SEL), and single event upset (SEU), confirming its suitability for demanding operational environments.
The sensor boasts a true High Dynamic Range (HDR) capability, allowing it to capture a wide spectrum of illumination levels without compromising on image quality. This functionality is complemented by a Motion Artifact Free (MAF) global shutter, ensuring sharp and distortion-free images even in high-speed scenarios. Furthermore, the back-side illumination (BSI) design enhances light absorption, improving image performance in low-light conditions.
With an emphasis on durability and versatility, the ELFIS2 offers users a reliable imaging solution that meets the requirements of specialized scientific and industrial applications. It stands out not only for its technical specifications but also for its ability to drive new possibilities in imaging applications from space exploration to cutting-edge microscopy.
